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Technical Tutorial Presentation “Improved ON-resistance Measurement at Wafer Probe using a DARUMA stage”@ SWTW 2017 06.10.2017

Semiconductor Wafer Test Workshop (SWTW) 2017 was held this week @ Rancho Bernardo Inn, San Diego, C...

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Tesec will exhibit at International Test Conference (ITC) 2017 05.06.2017

Tesec will exhibit at International Test Conference (ITC) 2017 held on October 31st - November 2nd....

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Tesec will join Semiconductor Wafer Test Workshop (SWTW) 2017 05.06.2017

Tesec will  join SWTW 2017 held on June 4th – 7th @ Rancho Bernardo Inn, San Diego, CA. Nob...

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Tesec will exhibit at MEMS SENSING & NETWORK SYSTEM 2016 08.16.2016

Tesec will exhibit at MEMS SENSING & NETWORK SYSTEM 2016 held on September 14th – 16th. T...

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Tesec will exhibit at International Test Conference (ITC) 07.18.2016

Tesec will exhibit at International Test Conference (ITC) held on November 15th - 17th. The booth...

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