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Technical Tutorial Presentation “Improved ON-resistance Measurement at Wafer Probe using a DARUMA stage”@ SWTW 2017

06.10.2017 | Category, Uncategorized

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Semiconductor Wafer Test Workshop (SWTW) 2017 was held this week @ Rancho Bernardo Inn, San Diego, CA, USA. Nobuyuki Toyoda (Manager, Tester Business Unit) provided technical tutorial presentation for “Improved ON-resistance Measurement at Wafer Probe using a DARUMA stage”  on June 5th (Mon).

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