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Tesec will join Semiconductor Wafer Test Workshop (SWTW) 2017

05.6.2017 | Category, News

swtest2017

Tesec will  join SWTW 2017 held on June 4th – 7th @ Rancho Bernardo Inn, San Diego, CA.

Nobuyuki Toyoda (Manager, Tester Business Unit) will make 30-minutes technical tutorial presentation for

“Reducing and stabilization of on-resistance by DARUMA stage”

in Session 4 (Contact & Performance) from 3:30-4:00 pm on June 5th (Monday).

http://www.swtest.org/

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