Tesec will join Semiconductor Wafer Test Workshop (SWTW) 2017
05.6.2017 | Category, News
Tesec will join SWTW 2017 held on June 4th – 7th @ Rancho Bernardo Inn, San Diego, CA.
Nobuyuki Toyoda (Manager, Tester Business Unit) will make 30-minutes technical tutorial presentation for
“Reducing and stabilization of on-resistance by DARUMA stage”
in Session 4 (Contact & Performance) from 3:30-4:00 pm on June 5th (Monday).