Tesec will exhibit at MEMS SENSING & NETWORK SYSTEM 2016
08.16.2016 | Category, News
Tesec will exhibit at MEMS SENSING & NETWORK SYSTEM 2016 held on September 14th – 16th.
The booth #D13 @ Paci... Read More 
Tesec will exhibit at International Test Conference (ITC)
07.18.2016 | Category, News
Tesec will exhibit at International Test Conference (ITC) held on November 15th - 17th.
The booth #219 @ Fort Worth Con... Read More
Tesec is recipient of 2015 Texas Instruments SEA
06.28.2016 | Category, News
Mr. Dan Colston, Director of TIWW Procurement & Logistics presented the 2015 Texas Instruments Supplier Excellence... Read More
Tesec Recognized as Outstanding Supplier for 2015
04.22.2016 | Category, News
Tesec Corporation (Tesec) a world leader in semiconductor test and handler systems has received Texas Instruments’ hig... Read More
Tesec will exhibit at Semicon and Nepcon Japan
12.11.2015 | Category, News
Tesec will exhibit at Semicon and Nepcon Japan. Please see details below.
Visit us @ Semicon Japan Booth East 2 Hall #2... Read More
An Official Notice of Relocation of Tesec Inc. LA office
08.27.2015 | Category, News
Please be informed that TESEC INC., Headquarters presently located at Baldwin Park, California will be relocated to Gard... Read More
New MEMS Handler ULTRA P (Model 4664-IH)
07.12.2014 | Category, Products
1. GENERAL
The ULTRA P is a high performance production handler that provides thermal
conditioning, full 6 DOF mecha... Read More
New Inductive Load Tester 4602-LV
03.17.2014 | Category, Products
New Inductive Load Tester 4602-LV
1. GENERAL
New Inductive Load tester 4602-LV/4602-HB has been newly developed... Read More
Data File Convertor MakeXlsx for Spektra ST4605
02.27.2014 | Category, Products
Data File Converter MakeXlsx for Spektra (ST4605)
1. General
MakeXlsx.exe is a software module which converts t... Read More
Termination of Support for Windows XP
02.12.2014 | Category, Topics
Announcement for the termination of support for Windows XP
Applicable Equipment
Applicable date for order accept... Read More