Technical Tutorial Presentation “Improved ON-resistance Measurement at Wafer Probe using a DARUMA stage”@ SWTW 2017
06.10.2017 | Category, News
Semiconductor Wafer Test Workshop (SWTW) 2017 was held this week @ Rancho Bernardo Inn, San Diego, CA, USA. Nobuyuki Toyoda (Manager, Tester Business Unit) provided technical tutorial presentation for “Improved ON-resistance Measurement at Wafer Probe using a DARUMA stage" on June 5th (Mon).