Inductive Load Tester
4602-LV
There is a tendency that MOSFET has Low On Resistance so that it demands that Inductive Load Tester to have higher forcing current for measurement. The forcing current is limited by forcing voltage with previous test method. Thus it becomes difficult to test this kind of middle power range devices.
The 4602-LV has new test method (*VD-OFF mode & Time-Trip mode).
*VD-OFF mode : It is the mode to separate the VD power at Avalanche.
*Time-Trip mode : It turns off the devices after specified time from forcing current.
Thus it can correspond with high current measurement. In addition, it is able to test wide range of devices by expanding the forcing voltage as 300V and forcing current as 200A.
Feature
- N / P channel can be measured with one test head
- The Peak Current (IDP) at Avalanche test can be measured
- Gate On Time can be measured
- Repeat test up to 250 times
- Multi test function (with fixed VD)
- Max. 60 test program can be stored
- VD-OFF mode
- SELF-CHECK FUNCTION
- Time-Trip mode
Software Options
- Test control software by PC
(Creating test programs, Data collections, counter)
| MODEL | 4602-LV |
|---|---|
| Drain Current (Id) | 0.5 - 200.0A |
| Peak Drain Current (Id) | 0.5 - 250.0A |
| Drain Voltage (Vd) | VD-ON MODE： 10.0V ~ 300.0V VD-OFF MODE： 10.0V ~ 200.0V |
| Gate Voltage (Vg) / Reverse Gate Voltage (Vgr) |
00.0 - 30.0V 00.0 - 30.0V |
| Clamp Voltage | Unclamp |
| Voltage Limit (V-GATE) |
0000 - 2000V 000.0 - 200.0V |
| IH Limit | 000.5 - 200.0A |
| IL Limit | 000.1 - 200.0A |
| Gate On Time (TG) | 000.0us - 9.999ms |
| Post Short Detecting Time (DT) | 001us - 9.99ms |
VD-ON MODE： 10.0V ~ 300.0V (3702-LV method)
VD-OFF MODE： 10.0V ~ 200.0V (4602-LV method)
